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[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - Smallest Vth variability achieved by intrinsic silicon on thin BOX (SOTB) CMOS with single metal gate

✍ Scribed by Morita, Y.; Tsuchiya, R.; Ishigaki, T.; Sugii, N.; Iwamatsu, T.; Ipposhi, T.; Oda, H.; Inoue, Y.; Torii, K.; Kimura, S.

Book ID: 118184015
Publisher: IEEE
Year: 2008
Weight: 492 KB
Volume: 0
Category: Article
ISBN: 142441802X
DOI: 10.1109/vlsit.2008.4588604

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