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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A study of SRAM NBTI by OTF measurement

✍ Scribed by Aono, H.; Murakami, E.; Shiga, K.; Fujita, F.; Yamamoto, S.; Ogasawara, M.; Yamaguchi, Y.; Yanagisawa, K.; Kubota, K.

Book ID: 126654608
Publisher: IEEE
Year: 2008
Weight: 421 KB
Category: Article
ISBN: 1424420490
DOI: 10.1109/RELPHY.2008.4558865

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