✦ LIBER ✦

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Reliability issues in MuGFET nanodevices

✍ Scribed by Groeseneken, G.; Crupi, F.; Shickova, A.; Thijs, S.; Linten, D.; Kaczer, B.; Collaert, N.; Jurczak, M.

No coin nor oath required. For personal study only.

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