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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Transient behavior of SCRS during ESD pulses

✍ Scribed by Esmark, Kai; Gossner, Harald; Bychikhin, Sergey; Pogany, Dionyz; Russ, Christian; Langguth, Gernot; Gornik, Erich

Book ID: 126751608
Publisher: IEEE
Year: 2008
Weight: 449 KB
Category: Article
ISBN: 1424420490
DOI: 10.1109/RELPHY.2008.4558894

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