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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Electrothermal model for MIM TaON capacitors during ESD HBM pulses

โœ Scribed by Verchiani, M.; Bouyssou, E.; Cantin, F.; Anceau, C.; Ranson, P.


Book ID
124053682
Publisher
IEEE
Year
2008
Tongue
English
Weight
120 KB
Edition
46
Category
Article
ISBN
1424420490

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