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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - NBTI degradation: From transistor to SRAM arrays

✍ Scribed by Huard, V.; Parthasarathy, C.; Guerin, C.; Valentin, T.; Pion, E.; Mammasse, M.; Planes, N.; Camus, L.

No coin nor oath required. For personal study only.

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