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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Multi-bit upsets in 65nm SOI SRAMs

✍ Scribed by Cannon, Ethan H.; Gordon, Michael S.; Heidel, David F.; KleinOsowski, A.J.; Oldiges, Phil; Rodbell, Kenneth P.; Tang, Henry H. K.

Book ID: 121089669
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 272 KB
Edition: 46
Category: Article
ISBN: 1424420490
DOI: 10.1109/RELPHY.2008.4558885

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