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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Multi-cell upset probabilities of 45nm high-k + metal gate SRAM devices in terrestrial and space environments

✍ Scribed by Seifert, N.; Gill, B.; Foley, K.; Relangi, P.

No coin nor oath required. For personal study only.

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