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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Time and voltage dependence of dielectric charging in RF MEMS capacitive switches

✍ Scribed by Herfst, R.W.; Steeneken, P.G.; Schmitz, J.

Book ID: 121801435
Publisher: IEEE
Year: 2007
Weight: 610 KB
Category: Article
ISBN-13: 9781424409198
DOI: 10.1109/RELPHY.2007.369926

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