𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - A Comprehensive Model for Hot Carrier Degradation in LDMOS Transistors

✍ Scribed by Moens, P.; Mertens, J.; Bauwens, F.; Joris, P.; De Ceuninck, W.; Tack, M.

Book ID: 121382373
Publisher: IEEE
Year: 2007
Weight: 311 KB
Category: Article
ISBN-13: 9781424409198
DOI: 10.1109/RELPHY.2007.369940

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2007 IEEE International Reliabilit

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Data Retention Characterization of Phase-Change Memory Arrays

✍ Gleixner, B.; Pirovano, A.; Sarkar, J.; Ottogalli, F.; Tortorelli, E.; Tosi, M.; 📂 Article 📅 2007 🏛 IEEE ⚖ 524 KB

[IEEE 2007 IEEE International Reliabilit

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - New Understanding of Metal-Insulator-Metal (MIM) Capacitor Degradation Behavior

✍ Hung, Chi-Chao; Oates, Anthony S.; Lin, H. C.; Chang, Percy; Wang, J.L.; Huang, 📂 Article 📅 2007 🏛 IEEE ⚖ 687 KB

[IEEE 2007 IEEE International Reliabilit

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - SEU and SET Modeling and Mitigation in Deep Submicron Technologies

✍ Mavis, David G.; Eaton, Paul H. 📂 Article 📅 2007 🏛 IEEE ⚖ 721 KB

[IEEE 2007 IEEE International Reliabilit

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Failure Mechanisms in MEMS Based Silicon Carbide High Temperature Pressure Sensors

✍ Okojie, R.S.; Nguyen, P.; Nguyen, V.; Savrun, E.; Lukco, D.; Buehler, J.; McCue, 📂 Article 📅 2007 🏛 IEEE ⚖ 727 KB

[IEEE 2007 IEEE International Reliabilit

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Time and voltage dependence of dielectric charging in RF MEMS capacitive switches

✍ Herfst, R.W.; Steeneken, P.G.; Schmitz, J. 📂 Article 📅 2007 🏛 IEEE ⚖ 610 KB

[IEEE 2007 IEEE International Reliabilit

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Single Event Upsets in a 130 nm Hardened Latch Design Due to Charge Sharing

✍ Amusan, O. A.; Sternberg, A. L.; Witulski, A. F.; Bhuva, B. L.; Black, J. D.; Ba 📂 Article 📅 2007 🏛 IEEE ⚖ 839 KB