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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Quantifying the Effectiveness of Guard Bands in Reducing the Collected Charge Leading to Soft Errors

✍ Scribed by Narasimham, B.; Shuler, R. L.; Black, J. D.; Bhuva, B. L.; Schrimpf, R. D.; Witulski, A. F.; Holman, W. T.; Massengill, L. W.

Book ID: 120740384
Publisher: IEEE
Year: 2007
Weight: 269 KB
Category: Article
ISBN-13: 9781424409198
DOI: 10.1109/RELPHY.2007.369565

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