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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The Impact of N-Drift Implant on ESD Robustness of High-Voltage NMOS with Embedded SCR Structure in 40-V CMOS Process

✍ Scribed by Chang, Wei-Jen; Ker, Ming-Dou; Lai, Tai-Xiang; Tang, Tien-Hao; Su, Kuan-Cheng

Book ID: 126627467
Publisher: IEEE
Year: 2007
Weight: 412 KB
Category: Article
ISBN: 1424410150
DOI: 10.1109/IPFA.2007.4378094

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