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[IEEE 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 - Singapore (9-13 July 2001)] Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) - ESD implantations in 0.18-μm salicided CMOS technology for on-chip ESD protection with layout consideration

✍ Scribed by Ming-Dou Ker, ; Che-Hao Chuang,

Book ID: 126743290
Publisher: IEEE
Year: 2001
Weight: 518 KB
Category: Article
ISBN-13: 9780780366756
DOI: 10.1109/IPFA.2001.941461

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