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[IEEE 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 - Singapore (9-13 July 2001)] Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) - ESD implantations in 0.18-μm salicided CMOS technology for on-chip ESD protection with layout consideration

✍ Scribed by Ming-Dou Ker, ; Che-Hao Chuang,


Book ID
126743290
Publisher
IEEE
Year
2001
Weight
518 KB
Category
Article
ISBN-13
9780780366756

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