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[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Novel ESD implantation for sub-quarter-micron CMOS technology with enhanced machine-model ESD robustness

✍ Scribed by Ming-Dou Ker, ; Hsin-Chyh Hsu, ; Jeng-Jie Peng,

Book ID: 126665191
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 499 KB
Category: Article
ISBN-13: 9780780374164
DOI: 10.1109/IPFA.2002.1025614

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