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[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution [CMOS]

✍ Scribed by Ming-Dou Ker, ; Jeng-Jie Peng, ; Hsin-Chin Jiang,

Book ID: 126662959
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 828 KB
Category: Article
ISBN-13: 9780780374164
DOI: 10.1109/IPFA.2002.1025617

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