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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - ESD protection design for high-speed I/O interface of stub series terminated logic (SSTL) in a 0.25-μm salicided CMOS process

✍ Scribed by Ming-Dou Ker, ; Che-Hao Chuang,

Book ID: 115510160
Publisher: IEEE
Year: 2004
Weight: 275 KB
Volume: 0
Category: Article
ISBN-13: 9780780384545
DOI: 10.1109/ipfa.2004.1345600

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