𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Light emission and TRE for a 120 nm technology case study: how much wavelength shift?

✍ Scribed by Remmach, M.; Desplats, R.; Perdu, P.; Roux, J.P.; Vallet, M.; Dudit, S.; Sardin, P.

Book ID: 126608872
Publisher: IEEE
Year: 2004
Weight: 290 KB
Category: Article
ISBN-13: 9780780384545
DOI: 10.1109/IPFA.2004.1345570

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Evaluating RF ESD protection design: An overview

✍ Guang Chen, ; Wang, A. 📂 Article 📅 2004 🏛 IEEE ⚖ 279 KB

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Magnetic microscopy for ICs failure analysis : comparative case studies using SQUID, GMR and MTJ systems

✍ Crepel, O.; Poirier, P.; Descamps, P. 📂 Article 📅 2004 🏛 IEEE ⚖ 271 KB

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Opportunities and challenges for high-k gate dielectrics

✍ Ma, T.P. 📂 Article 📅 2004 🏛 IEEE ⚖ 273 KB

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Single-event-induced barrier lowering in deep-submicron MOS devices and circuits

✍ Jain, P.; Vasi, J.; Lal, R. 📂 Article 📅 2004 🏛 IEEE ⚖ 276 KB

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Catastrophic failure of power silicon PN junctions at high temperature induced by the surface leakage reverse current

✍ Obreja, V.V.N.; Buiu, O.; Nuttall, K.I.; Codreanu, C.; Sung, M.L.; Pei, P. 📂 Article 📅 2004 🏛 IEEE ⚖ 291 KB

[IEEE Proceedings of the 11th Internatio

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - New latch-up failure mechanism between different power pins in the mixed-voltage process [CMOS ICs]

✍ Chau-Neng Wu, ; Chou, H.-M. 📂 Article 📅 2004 🏛 IEEE ⚖ 302 KB