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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Single-event-induced barrier lowering in deep-submicron MOS devices and circuits

✍ Scribed by Jain, P.; Vasi, J.; Lal, R.

Book ID: 126730589
Publisher: IEEE
Year: 2004
Weight: 276 KB
Category: Article
ISBN-13: 9780780384545
DOI: 10.1109/IPFA.2004.1345627

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