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[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - A novel method for accurately estimating alpha-induced soft error rates

✍ Scribed by Takasu, R.; Tosaka, Y.; Fukuda, H.; Karaoka, Y.

Book ID: 115524962
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 747 KB
Edition: 2005
Volume: 0
Category: Article
ISBN-13: 9780780388031
DOI: 10.1109/relphy.2005.1493089

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