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[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Negative bias temperature instability (NBTI) of bulk FinFETs

✍ Scribed by Sang-Yan Kim, ; Tai-su Park, ; Jac-Sung Lee, ; Donggum Park, ; Ki-Nam Kim, ; Jong-Ho Lee,

Book ID: 126620447
Publisher: IEEE
Year: 2005
Weight: 536 KB
Category: Article
ISBN-13: 9780780388031
DOI: 10.1109/RELPHY.2005.1493143

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