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[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - A new neutron facility for single-event effect testing

✍ Scribed by Prokofiev, A.V.; Pomp, S.; Blomgren, J.; Bystrom, O.; Ekstrom, C.; Jonsson, O.; Reistad, D.; Tippawan, U.; Wessman, D.; Ziemann, V.; Osterlund, M.

Book ID: 126614481
Publisher: IEEE
Year: 2005
Weight: 379 KB
Category: Article
ISBN-13: 9780780388031
DOI: 10.1109/RELPHY.2005.1493209

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