𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Copper via chain under etching process improvement

✍ Scribed by Ji, J.; Zhang, M.; Dong, W.; Guo, A.; Liang, S.; Liao, S.; Niou, C.; Chien, K.

Book ID: 126710200
Publisher: IEEE
Year: 2005
Weight: 353 KB
Category: Article
ISBN-13: 9780780388031
DOI: 10.1109/RELPHY.2005.1493206

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2005 IEEE International Reliabilit

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Reliability of 4MBIT MRAM

✍ Akerman, J.; Brown, P.; Gajewski, D.; Griswold, M.; Janesky, J.; Martin, M.; Mek 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 916 KB

[IEEE 2005 IEEE International Reliabilit

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Stress migration and the mechanical properties of copper

✍ Alers, G.B.; Sukamto, J.; Woytowitz, P.; Lu, X.; Kailasam, S.; Reid, J. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 884 KB

[IEEE 2005 IEEE International Reliabilit

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Gate oxide reliability of 4H-SiC MOS devices

✍ Krishnaswami, S.; Das, M.; Hull, B.; Sei-Hyung Ryu, ; Scofield, J.; Agarwal, A.; 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 401 KB

[IEEE 2005 IEEE International Reliabilit

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Negative bias temperature instability (NBTI) of bulk FinFETs

✍ Sang-Yan Kim, ; Tai-su Park, ; Jac-Sung Lee, ; Donggum Park, ; Ki-Nam Kim, ; Jon 📂 Article 📅 2005 🏛 IEEE ⚖ 536 KB

[IEEE 2005 IEEE International Reliabilit

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - A new neutron facility for single-event effect testing

✍ Prokofiev, A.V.; Pomp, S.; Blomgren, J.; Bystrom, O.; Ekstrom, C.; Jonsson, O.; 📂 Article 📅 2005 🏛 IEEE ⚖ 379 KB

[IEEE 2005 IEEE International Reliabilit

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - A study of electromigration failure in PB-free solder joints

✍ Min Ding, ; Guotao Wang, ; Chao, B.; Ho, P.S.; Peng Su, ; Uehling, T.; Wontor, D 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 1010 KB