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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Development and extraction of high-frequency SPICE models for metal-insulator-metal capacitors

✍ Scribed by Cai, W.Z.; Shastri, S.C.; Azam, M.; Hoggatt, C.; Loechelt, G.H.; Grivna, G.M.; Wen, Y.; Dow, S.

Book ID: 126693652
Publisher: IEEE
Year: 2004
Weight: 216 KB
Category: Article
ISBN-13: 9780780382626
DOI: 10.1109/ICMTS.2004.1309485

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