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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Characterization and model of 4-terminal RF CMOS with bulk effect

✍ Scribed by Yang, M.T.; Wang, Y.J.; Yeh, T.J.; Ho, P.P.C.; Chia, Y.T.; Young, K.L.

Book ID: 125425908
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 306 KB
Category: Article
ISBN-13: 9780780382626
DOI: 10.1109/icmts.2004.1309477

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