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[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Is product screen enough to guarantee low failure rate for the customer?

✍ Scribed by Ruprecht, M.W.; La Rosa, G.; Filippi, R.G.

Book ID: 126763854
Publisher: IEEE
Year: 2001
Weight: 623 KB
Category: Article
ISBN-13: 9780780365872
DOI: 10.1109/RELPHY.2001.922874

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