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Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and its Influence on the Interface Properties

✍ Scribed by Kropman, Daniel; Mellikov, E.; Kärner, T.; Ugaste, Ü.; Laas, Tony; Heinmaa, I.; Abru, U.; Medvid, Arthur

Book ID: 126476053
Publisher: Trans Tech Publications, Ltd.
Year: 2007
Tongue: English
Weight: 277 KB
Volume: 131-133
Category: Article
ISSN: 1662-9779
DOI: 10.4028/www.scientific.net/SSP.131-133.345

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