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Point Defects Interaction with Extended Defects and Impurities and Its Influence on the Si-SiO2 System Properties

✍ Scribed by Kropman, Daniel; Abru, U.; Kärner, T.; Ugaste, U.; Mellikov, E.; Kauk, M.; Heinmaa, I.; Samoson, A.; Medvid, Arthur


Book ID
119993531
Publisher
Trans Tech Publications, Ltd.
Year
2005
Tongue
English
Weight
316 KB
Volume
108-109
Category
Article
ISSN
1662-9779

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