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Dedicated in the Memory of Professor Ulrich Gösele. Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Interface Properties

✍ Scribed by Daniel Kropman; Tiit Kärner; Sergei Dolgov; Ivo Heinmaa; C.A. Londos


Book ID
116833379
Publisher
Elsevier
Year
2012
Tongue
English
Weight
768 KB
Volume
32
Category
Article
ISSN
1875-3892

No coin nor oath required. For personal study only.


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