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Impurity interaction with point defects in the Si–SiO2 structures and its influence on the interface properties

✍ Scribed by D. Kropman; E. Mellikov; T. Kärner; Ü. Ugaste; T. Laas; I. Heinmaa; A. Medvid

Book ID: 108215396
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 497 KB
Volume: 134
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2006.07.029

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