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Hot-carrier charge trapping and trap generation in HfO[sub 2] and Al[sub 2]O[sub 3] field-effect transistors

✍ Scribed by Kumar, Arvind; Fischetti, Massimo V.; Ning, Tak H.; Gusev, Evgeni

Book ID: 121208251
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 486 KB
Volume: 94
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1586985

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