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Comparison of near-interface traps in Al[sub 2]O[sub 3]∕4H-SiC and Al[sub 2]O[sub 3]∕SiO[sub 2]∕4H-SiC structures

✍ Scribed by Avice, Marc; Grossner, Ulrike; Pintilie, Ioana; Svensson, Bengt G.; Nilsen, Ola; Fjellvag, Helmer


Book ID
121512845
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
256 KB
Volume
89
Category
Article
ISSN
0003-6951

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