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High-temperature characteristics of high-quality SiC MIS capacitors with O/N/O gate dielectric

✍ Scribed by Wang, X.W.; Luo, Z.J.; Tso-Ping Ma

Book ID: 114538047
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 127 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.822294

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