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High-quality oxide/nitride/oxide gate insulator for GaN MIS structures

✍ Scribed by Gaffey, B.; Guido, L.J.; Wang, X.W.; Ma, T.P.

Book ID: 114538593
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 132 KB
Volume: 48
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.906436

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