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Demonstration of AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors with silicon-oxy-nitride as the gate insulator

✍ Scribed by K. Balachander; S. Arulkumaran; T. Egawa; Y. Sano; K. Baskar


Book ID
108215160
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
289 KB
Volume
119
Category
Article
ISSN
0921-5107

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Fabrication of AlGaN/GaN double-insulato
✍ Balachander, Krishnan ;Arulkumaran, Subramaniam ;Sano, Y. ;Egawa, Takashi ;Baska 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 164 KB

## Abstract We report on the fabrication of AlGaN/GaN double‐insulator MOSHEMTs using SiO~2~ and SiN as the prime gate insulators. Both the dielectrics showed enhanced saturation current density and pinch‐off voltage compared to conventional HEMTs. The SiO~2~/SiN/AlGaN/GaN MOSHEMTs exhibited a low