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Growth and characterization of Si1−xGetxQDs on Si/Si0.8Ge0.2layer

✍ Scribed by Taek Sung Kim, Yeon-Ho Kil, Hyeon Deok Yang, Jong-Han Yang, Woong-Ki Hong, Sukill Kang, Tae Soo Jeong, Kyu-Hwan Shim


Book ID
118303735
Publisher
The Korean Institute of Metals and Materials
Year
2012
Tongue
English
Weight
445 KB
Volume
8
Category
Article
ISSN
1738-8090

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