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Enhanced thermal and morphological stability of Ni(Si1−xGex) growth on -preamorphized Si0.8Ge0.2 substrate

✍ Scribed by J.H. He; W.W. Wu; L.J. Chen


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
219 KB
Volume
237
Category
Article
ISSN
0168-583X

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Single-crystal Ge 1 À x Sn x alloys (x ¼ 0.025, 0.052, and 0.078) with diamond cubic structure have been grown on Si(0 0 1) substrates by molecular beam epitaxy (MBE), using high-quality Ge thin films as buffer layers. The Ge 1 À x Sn x alloys are nearly fully strained and have high crystalline qual