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Gate-voltage dependence of source and drain series resistances and effective gate length in GaAs MESFETs

โœ Scribed by Byun, Y.H.; Shur, M.S.; Peczalski, A.; Schuermeyer, F.L.


Book ID
114535519
Publisher
IEEE
Year
1988
Tongue
English
Weight
496 KB
Volume
35
Category
Article
ISSN
0018-9383

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