Source, drain, and gate series resistances and electron saturation velocity in ion-implanted GaAs FET's

✍ Scribed by Lee, K.W.; Kwyro Lee; Shur, M.S.; Tho T. Vu; Roberts, P.C.T.; Helix, M.J.

• Book ID: 114595157
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 481 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22058