✦ LIBER ✦

Gate-fringing field effects on high performance in high dielectric LDD spacer MOSFETs

✍ Scribed by Mizuno, T.; Kobori, T.; Saitoh, Y.; Sawada, S.; Tanaka, T.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Performance and reliability evaluation o

✍ Jyh-Chyurn Guo; Chih-Yua Lu; Hsu, C.C.-H.; Pole-Shan Lin; Chung, S.S.-S. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 950 KB

High-Performance Gate-First Epitaxial Ge

✍ Chen, W.B.; Cheng, C.H.; Chin, A. 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 659 KB

Influence of sidewall spacer on threshol

✍ J.P. Xu; F. Ji; P.T. Lai; J.G. Guan 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 205 KB

A new grounded lamination gate (GLG) for

✍ Kumar, M.J.; Venkataraman, V.; Gupta, S.K. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 433 KB

Fringing-Induced Drain Current Improveme

✍ Schlosser, M.; Bhuwalka, K.K.; Sauter, M.; Zilbauer, T.; Sulima, T.; Eisele, I. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 506 KB

The Impact of Fringing Field on the Devi

✍ Mallik, A.; Chattopadhyay, A. 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 797 KB