✦ LIBER ✦
Performance and reliability evaluation of high dielectric LDD spacer on deep sub-micrometer LDD MOSFET
✍ Scribed by Jyh-Chyurn Guo; Chih-Yua Lu; Hsu, C.C.-H.; Pole-Shan Lin; Chung, S.S.-S.
- Book ID
- 114535768
- Publisher
- IEEE
- Year
- 1994
- Tongue
- English
- Weight
- 950 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.