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The Impact of Fringing Field on the Device Performance of a p-Channel Tunnel Field-Effect Transistor With a High- Gate Dielectric

โœ Scribed by Mallik, A.; Chattopadhyay, A.


Book ID
114620790
Publisher
IEEE
Year
2012
Tongue
English
Weight
797 KB
Volume
59
Category
Article
ISSN
0018-9383

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