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GaN metal-oxide-semiconductor field-effect-transistor with atomic layer deposited Al2O3 as gate dielectric

✍ Scribed by Y.Q. Wu; P.D. Ye; G.D. Wilk; B. Yang


Book ID
108215403
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
287 KB
Volume
135
Category
Article
ISSN
0921-5107

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