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Fault Models and Test Generation for OpAmp Circuits—The FFM

✍ Scribed by José Vicente Calvano; Antônio Carneiro de Mesquita Filho; Vladimir Castro Alves; Marcelo Soares Lubaszewski

Book ID: 110298077
Publisher: Springer US
Year: 2001
Tongue: English
Weight: 296 KB
Volume: 17
Category: Article
ISSN: 0923-8174
DOI: 10.1023/a:1011169626409

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