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CMOS fault modeling, test generation and design for testability

✍ Scribed by C Matthäus; B Krüger-Sprengel; C Glowacz; U Hübner; H.T Vierhaus

Publisher: Elsevier Science
Year: 1988
Weight: 406 KB
Volume: 24
Category: Article
ISSN: 0165-6074
DOI: 10.1016/0165-6074(88)90059-2

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