𝔖 Bobbio Scriptorium
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CMOS fault modeling, test generation and design for testability

✍ Scribed by C Matthäus; B Krüger-Sprengel; C Glowacz; U Hübner; H.T Vierhaus


Publisher
Elsevier Science
Year
1988
Weight
406 KB
Volume
24
Category
Article
ISSN
0165-6074

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Based on the trends in development of integrated circuits {IC) until the year 2000 it is shown that, presuming the present capability of electron beam test systems, in future an electron beam test {EBT) will not be practicable anymore. This is mainly due to long measurement times, large measurement