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Extraction of gate dependent source/drain resistance and effective channel length in MOS devices at 77 K

โœ Scribed by Hwang, C.Y.; Tsung-Chia Kuo; Woo, J.C.S.


Book ID
114536300
Publisher
IEEE
Year
1995
Tongue
English
Weight
332 KB
Volume
42
Category
Article
ISSN
0018-9383

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