✦ LIBER ✦
At bias extraction of parasitic source and drain resistances in AlGaN/GaN HFETs: bias dependence and implications for device modelling and physics
✍ Scribed by D. W. DiSanto; C. R. Bolognesi
- Book ID
- 104557885
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 219 KB
- Volume
- 3
- Category
- Article
- ISSN
- 1862-6351
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