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Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method

✍ Scribed by Junsoo Kim; Jaehong Lee; Ickhyun Song; Yeonam Yun; Jong Duk Lee; Byung-Gook Park; Hyungcheol Shin

No coin nor oath required. For personal study only.

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