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A new approach to determine the effective channel length and the drain-and-source series resistance of miniaturized MOSFET's

✍ Scribed by Jyh-Chyurn Guo; Chung, S.S.-S.; Hsu, C.C.-H.


Book ID
114535903
Publisher
IEEE
Year
1994
Tongue
English
Weight
787 KB
Volume
41
Category
Article
ISSN
0018-9383

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