A new method for extracting the channel-length reduction and the gate-voltage-dependent series resistance of counter-implanted p-MOSFETs

✍ Scribed by Chien-Min Wu; Ching-Yuan Wu

• Book ID: 114537077
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 258 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.644635