✦ LIBER ✦
A novel single-device DC method for extraction of the effective mobility and source-drain resistances of fresh and hot-carrier degraded drain-engineered MOSFET's
✍ Scribed by Choon-Leong Lou; Wai-Kin Chim; Chan, D.S.-H.; Tang Pan
- Book ID
- 114537300
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 250 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9383
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